[25p-E302-1~18] 3.8 Optical measurement, instrumentation, and sensor

△ [25p-E302-13] Speeding Up Luminescence Lifetime Measurements with Pseudo-Randomly Modulated Excitation Light Employing Logic Gate and Source Current Modulation

〇sota ui¹, Keisuke Seto¹, Takayoshi Kobayashi², Eiji Tokunaga¹ (1.Tokyo Univ. Sci., 2.Univ. Electro-Commun.)

Keywords:Fluorescence Lifetime Imaging, Fluorescence microscope

In conventional fluorescence lifetime measurement, the lifetime is evaluated from the relaxation curve of pulse-excited emission. The curve is measured with the increased luminous photon number by modulating the excitation light with a pseudo-random pulse sequence and convoluting the emission signal and the modulation waveform. In this study, to speed up the measurement procedure, the pseudo-random sequence is generated by logic gates, and the diode laser is current modulated. We also investigate factors, such as finite transition speed of the pulses of the sequence, causing the systematic error in the present method. Based on the investigated deteriorating factors, we will improve the measurement accuracy.