[25p-E304-1~15] 12.2 Characterization and Materials Physics

[25p-E304-8] Development of Electron Gun for Inverse Photoelectron Spectroscopy Having the Energy Resolution Better than 100 meV

〇Haruki Sato¹, Mihiro Kubo¹, Francois C. Bocquet⁴, F. Stefan Tautz⁴, Harald Ibach⁴, Hiroyuki Yoshida^2,3 (1.Sci. and Eng., Chiba Univ., 2.Eng., Chiba Univ., 3.MCRC, Chiba Univ., 4.Forschungszentrum Juelich)

Keywords:Electron gun, Organic semiconductor, Inverse photoelectron spectroscopy

The inferiority of the electron transport property in organic semiconductors has been a long-standing issue. In order to move forward with the issue, it is meaningful to precisely observe conduction band structures derived from LUMO by improving the total energy resolution of low energy inverse photoelectron spectroscopy (LEIPS) to under 100 meV. The present total energy resolution of LEIPS is limited to about 220 meV due to the thermal energy spread. Therefore, in this work, we developed a new electron gun with an energy analyzer. This is based on the electron gun developed for high resolution electron energy loss spectroscopy (HREELS) and is improved to extract 1000 times more current than HREELS. According to a simulation of the electron trajectory incorporating space charge effect, an electron beam with the exit current of 250 nA can be extracted with an energy spread of 52 meV from the electron gun. In this presentation, we are going to report the performance evaluation results of the developed electron gun.