EFM, KPFM measurement of plasmon-induced charge separation on Au nano-particle/ TiO<sub>2</sub> interface

Presentation information

Poster presentation

6 Thin Films and Surfaces » 6.6 Probe Microscopy

Fri. Mar 25, 2022 1:30 PM - 3:30 PM P03 (Poster)

1:30 PM - 3:30 PM

〇Tomoki Misaka¹, Kentaro Kajimoto¹, Hiroshi Ohyama¹, Takuya Matsumoto¹ (1.Osaka Univ.)

Keywords:plasmon-induced charge separation, Atomic force microscopy