The 69th JSAP Spring Meeting 2022

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6 Thin Films and Surfaces » 6.6 Probe Microscopy

[26a-E105-1~11] 6.6 Probe Microscopy

Sat. Mar 26, 2022 9:00 AM - 12:00 PM E105 (E105)

Yoshiaki Sugimoto(Univ. of Tokyo), Osamu Kubo(Osaka Univ.)

9:45 AM - 10:00 AM

[26a-E105-3] Quantitative carrier density measurements in FM-EFM

〇Ryota Fukuzawa1, Jianbo Liang3, Naoteru Shigekawa3, Takuji Takahashi1,2 (1.IIS, The Univ. of Tokyo, 2.NanoQuine, 3.Osaka City University)

Keywords:Atomic force microscopy, C-V, interface states