2:45 PM - 3:00 PM
△ [26p-E301-5] Failure Analysis of Electrostatic Discharged InP/InGaAs Photodiode
Keywords:Photodiode, Electrostatic Discharge, Failure Analysis
Oral presentation
3 Optics and Photonics » 3.13 Semiconductor optical devices
Sat. Mar 26, 2022 1:30 PM - 5:00 PM E301 (E301)
Taro Arakawa(Yokohama Natl. Univ.), Tomoyuki Miyamoto(Tokyo Tech)
2:45 PM - 3:00 PM
Keywords:Photodiode, Electrostatic Discharge, Failure Analysis