1:30 PM - 1:45 PM △ [16p-B414-3] Local deep level transient spectroscopy measurement of MoS2 mechanically exfoliated on SiO2 using scanning nonlinear dielectric microscopy 〇Taiyo Ishizuka1,2, Kohei Yamasue2 (1.Tohoku Univ., 2.RIEC, Tohoku Univ.)