Yoshitaka Kato

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Speaker, Author, Co-Author

Fri. Mar 17, 2023 9:00 AM - 11:45 AM A403 (Building No. 6)

Oral presentation
| 13 Semiconductors
| 13.5 Semiconductor devices/ Interconnect/ Integration technologies

[17a-A403-1~10] 13.5 Semiconductor devices/ Interconnect/ Integration technologies

11:30 AM - 11:45 AM

[17a-A403-10] Possible Use of Band-to-Band Tunneling in Soft-Error Reliability Prediction

〇(M2)Yoshitaka Kato^1,2, Daisuke Kobayashi², Kazuyuki Hirose^1,2 (1.UTokyo, 2.ISAS)