Exhibitors' information
[A-20] Bruker Japan K.K.
XRD, X-Ray Metrology for Compound Semiconductor, AFM, Nanoscale Infrared Spectrometer, Indenter
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Address
104-0033
東京都中央区新川1-4-1 -
Tel
03-3523-6361
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Fax
03-3523-6364
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Web site, SNS