The 70th JSAP Spring Meeting 2023

Presentation information

Oral presentation

15 Crystal Engineering » 15.6 Group IV Compound Semiconductors (SiC)

[15p-A301-1~13] 15.6 Group IV Compound Semiconductors (SiC)

Wed. Mar 15, 2023 1:00 PM - 4:45 PM A301 (Building No. 6)

Takeshi Mitani(AIST), Hirokuni Asamizu(ローム)

4:00 PM - 4:15 PM

[15p-A301-11] Influence of pulsed applied voltage on voltage-controlled anodization of fluorescent 4H-SiC

〇(B)Taisei Mizuno1, Keita Kodera1, Shota Akiyoshi1, Motoaki Iwaya1, Tetsuya Takeuchi1, Satoshi Kamiyama1, Weifang Lu2, Yiyu Ou3 (1.Meijo Univ., 2.Xianmen Univ., 3.Technical University of Denmark)

Keywords:semiconductor, optical device, SiC

By forming fine holes (porous) on the substrate surface of fluorescent SiC, which is SiC doped with high concentration of B and N, by anodic oxidation etching, it is possible to shorten the wavelength and increase the intensity of the emitted light. It is expected that this will lead to the realization of white LEDs with broad spectrum and high color rendering properties. Fluorescent SiC is difficult to etch, so it has not been possible to obtain pores with sufficient shape and thickness. In this report, it was confirmed that applying a negative bias voltage during anodization is effective for anodization.