[16a-A404-1~7] Machine learning on dielectrics study

[16a-A404-4] Statistical Evaluation of Correlation Between Grain Boundaries and Ferroelectric Domain Behavior Based on Machine Learning Analysis of Local C-V Maps

〇Yoshiomi Hiranaga¹, Yuki Noguchi¹, Takanori Mimura², Takao Shimizu², Hiroshi Funakubo², Yasuo Cho¹ (1.Tohoku Univ., 2.Tokyo Tech.)

Keywords:ferroelectrics, scanning probe microscopy, machine learning

In this talk, we will discuss a method to microscopically analyze the domain dynamics in ferroelectric films by a measurement informatics approach that combines scanning probe microscopy technique called local C-V mapping and machine learning.