2023年第70回応用物理学会春季学術講演会

講演情報

一般セッション(口頭講演)

6 薄膜・表面 » 6.6 プローブ顕微鏡

[16a-D405-1~8] 6.6 プローブ顕微鏡

2023年3月16日(木) 09:30 〜 11:45 D405 (11号館)

大塚 洋一(阪大)

10:30 〜 10:45

[16a-D405-4] Atomic force microscopy studies on ionic liquids at solid interfaces and their surface charge dependences

〇(DC)Yifan Bao1、Takashi Ichii1、Toru Utsunomiya1、Hiroyuki Sugimura1 (1.Kyoto Univ.)

キーワード:Ionic liquid, Atomic force microscopy (AFM), Solid-liquid interface

Understanding interfacial structures of ionic liquid (IL) on electrified solid surfaces is vital to electrochemical reactions occurring at IL-electrode interfaces, as well as electrically-controlled lubrications using IL as a lubricant. However, the effect of surface charge on interfacial structures of IL is still a subject of debate partly because narrow ranges of surface charges have been experimentally investigated so far. Recently, we have succeeded in preparing rubidium iodide (RbI) crystals exposing polar (111) surfaces in IL (Py13-TFSI). This kind of highly charged surfaces renders investigating surface-charge-dependent changes in interfacial IL across a wider range of surface charge densities viable. In this study, frequency modulation AFM, capable of visualising IL-solid interfaces on atomic/molecular scales, is used to probe interfacial structures of Py13-TFSI at two surfaces featuring distinct surface charges: a highly charged RbI (111) surface as well as a moderately charged muscovite mica (001) cleavage surface, and their surface-charge dependences are discussed.