[16a-D519-1~14] CS.1 Code-sharing Session of 2.3 & 7.4 &7.5

[16a-D519-14] Gamma-ray intensity from ¹¹⁵In induced by grazing-incidence neutrons on an InP substrate measured as a function of neutron glancing angle

〇Dai Yamazaki¹, Mari Mizusawa², Atsushi Moriai¹, Masayasu Takeda¹, Hideaki Matsue¹, Kenji Sakurai³ (1.JAEA, 2.CROSS, 3.NIMS)

Keywords:surface/interface, total reflection neutron, prompt gamma ray

We propose a novel promising analytical method named "Total reflection neutron induced gamma spectroscopy (TN-gamma)", which is suitable for probing nuclear composition of the layers and interfaces deeply buried under thick protection materials.
In the experiment gamma intensities from ¹¹⁵In nuclei in an InP wafer was measured as functions of neutron glancing angle to the wafer.