The 70th JSAP Spring Meeting 2023

Presentation information

Oral presentation

10 Spintronics and Magnetics » 10.3 Spin devices, magnetic memories and storages

[16a-D704-1~10] 10.3 Spin devices, magnetic memories and storages

Thu. Mar 16, 2023 9:15 AM - 12:00 PM D704 (Building No. 11)

Hiroaki Sukegawa(NIMS), Kenji Tanabe(Toyota Technol. Inst.)

9:30 AM - 9:45 AM

[16a-D704-2] Reduction of Write-Error Rates in Voltage-Induced Dynamic Precessional Switching by Elliptical Cylinder Recording Layers

Rie Matsumoto1, Shinji Yuasa1, Imamura Hiroshi1 (1.AIST)

Keywords:spintronics, VCMA, MRAM

Voltage-controlled MRAMs (VCMRAMs) based on dynamic precessional switching in magnetic tunnel junctions (MTJs) are expected to be the ultimate low-power non-volatile memory devices. However, the high write error rate (WER) hinders the reliable operation of VCMRAMs. To significantly reduce the WER, we focused on the lateral shape of the MTJ, which is a circular cylinder in conventional MTJs. In this study, we propose a novel switching method using an elliptical-cylinder MTJ that attains substantially low WERs. Our analysis clarified that the WER is reduced by the reduced voltage-pulse duration, which is enabled by the energy profile of elliptic cylinder-shaped nanomagnets.