1:30 PM - 2:00 PM
[16p-A404-1] Current status of crystal structure analysis using transmission electron microscopy
Keywords:electron microscopy, structure analysis
Transmission electron microscopy (TEM) is one of standard material characterization tools. TEM includes various techniques, such as real-space microscopic observation (imaging), crystallographic analyses using electron diffraction (diffractometry) and spectroscopic methods for elemental analysis, etc.. Here we briefly review the current status of atomic imaging using scanning transmission electron microscopy (STEM) and diffractometry by 4-dimensional (4D) STEM. A few applications of disordered/amorphous materials will be presented.