High Sensitivity Measurement of Optically Detected Magnetic Resonance Measurement System Using Lock-in Detection Method

Yoshikazu Shimeno; Shotaro Kawai; Yuji Kuwamura; Takeo Maruyama

Presentation information

Oral presentation

6 Thin Films and Surfaces » 6.2 Carbon-based thin films

[16p-A408-1~18] 6.2 Carbon-based thin films

Thu. Mar 16, 2023 1:00 PM - 5:45 PM A408 (Building No. 6)

Hiroshi Abe(QST), Masazumi Fujiwara(Okayama Univ.), Hiromitsu Kato(AIST), Norikazu Mizuochi(京大)

4:45 PM - 5:00 PM

[16p-A408-15] High Sensitivity Measurement of Optically Detected Magnetic Resonance Measurement System Using Lock-in Detection Method

〇(M1)Yoshikazu Shimeno¹, Shotaro Kawai¹, Yuji Kuwamura¹, Takeo Maruyama¹ (1.Kanazawa Univ.)

Keywords:NV Center, Lock-in Detection Method, ODMR

We constructed a magnetic sensor measurement system by ODMR using the lock-in method, and observed the peak from the NV center and the splitting of the resonance frequency due to an external magnetic field using conventional PD.