11:15 AM - 11:30 AM
[17a-A301-9] Long Stress (190h) Measurements of Diamond MOSFET
Keywords:diamond, stress measurement, MOSFET
We report long stress measurement of diamond MOSFET.
Oral presentation
13 Semiconductors » 13.7 Compound and power devices, process technology and characterization
Fri. Mar 17, 2023 9:00 AM - 11:30 AM A301 (Building No. 6)
Taketomo Sato(Hokkaido Univ.)
11:15 AM - 11:30 AM
Keywords:diamond, stress measurement, MOSFET