The 70th JSAP Spring Meeting 2023

Presentation information

Oral presentation

3 Optics and Photonics » 3.7 Optical measurement, instrumentation, and sensor (formerly 3.8)

[17a-A502-1~8] 3.7 Optical measurement, instrumentation, and sensor (formerly 3.8)

Fri. Mar 17, 2023 9:30 AM - 11:45 AM A502 (Building No. 6)

Tatsutoshi Shioda(Saitama Univ.), Takashi Kato(UEC)

9:30 AM - 9:45 AM

[17a-A502-1] Basic Study of Spectral Measurement using Sub-bin on SD-OCT

〇(B)Kouhei Kawada1, Junpei Masuta1, Tetsuo Kosaka1, Manabu Sato1 (1.Yamagata Univ.)

Keywords:DFT, sub-bin, resolution

We have proposed the sub-bin to improve the frequency resolution in DFT. Sub-bins are the bins assigned between the two conventional bins in DFT. Here, we report the application of the spectral analysis using sub-bin to SD-OCT.
Optical setup consists of SLD of wavelength of 0.8um and the conventional Michelson interferometer. The number of data was 256. When the optical path difference was tuned to the frequency between the conventional two bins, the position information of sample mirror could not be obtained. But with the proposed method using sub-bins, that information could be obtained. However, the precision was not enough.