[17p-PA08-1~7] 6.5 Surface Physics, Vacuum

[17p-PA08-7] Soft X-ray Appearance Potential Spectroscopy of Oxide Powder

〇Takayuki Kashiwakura¹ (1.Utsunomiya Univ.)

Keywords:appearance potential spectroscopy, bulk sensitive, chemical state analysis

We developed a soft x-ray appearance potential spectroscopy (SXAPS) apparatus with an x-ray spectrometer which behaves as a band pass filter. SXAPS was measured for oxide powder samples with a conductive cover layer, which was formed to reduce sample charging. Both of the SXAP spectra measured for a CeO₂ powder sample at the Ce M₅ and M₄ absorption edge show a peak structure similar to that of XANES. Charge-up effects in SXAP spectra and origins of line broadening are discussed.