[18a-A401-1~9] 23.1 Joint Session N "Informatics"

[18a-A401-3] Measurement and Basic Data Analysis of Gigapixel Imaging XAFS

〇Yasuo Takeichi¹, Yusei Ito¹, Yasuhiro Niwa², Masao Kimura², Kanta Ono¹ (1.Osaka Univ., 2.KEK)

Keywords:XAFS, imaging, chemical state

We have developed gigapixel imaging XAFS method with submicron spatial resolution and the field of view larger than 10 mm. Analyzing XAFS spectrum of each pixel provided the distribution of Fe oxidation state and chemical composition within iron ore sinter sample. This method enables understanding the inhomogeneous propagation of reduction reaction through the microstructures of sinters. It also provides enormous number of XAFS spectra suitable for statistical analyses.