技術開発 (2)

[VI-190] Verification of resistivity measurement depth using capacitively coupled electorode

*Akihiro Matsumoto¹, Ichizo Kobayashi¹, Michitaka Okamoto¹, Takashi Obara¹, Satoshi Sakamoto¹, Yoshikatsu Yonemaru¹, Yo Fukushima¹ (1. KAJIMA CORPORATION)

Keywords:embankment, Quality management, Electrical characteristics, resistivity