The 20th Annual Meeting of Japan Society of Kansei Engineering

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一般セッション

[B4] 計測・評価2（計測・評価／脳科学）

Wed. Sep 5, 2018 3:00 PM - 5:15 PM Room B (211)

座長:野村収作（長岡技術科学大学）

4:45 PM - 5:00 PM

[B4-08] EEG Activities Reflecting Purchasing Intention

Topographical Analysis

*Hirohiro Sawahata1, Yoshiko Nakamura1, Yukako T. Hasegawa1, Ryohei R. Hasegawa1 (1. National Institute of Advanced Industrial Science and Technology (AIST))

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