[J122p] 解析・設計の高度化・最適化［ポスター］

[J122p-08] Improvement of analysis precision of STM images on InP surface by using machine learning

〇Tatsuyoshi Takahashi¹, Eiichi Inami¹ (1. 高知工科大学)

Keywords:機械学習、走査型トンネル顕微鏡、InP