44th Autumn congress of Japanese Society of Radiological Technology

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一般演題（口頭）

Imaging

Imaging　System evaluation

Thu. Oct 13, 2016 5:20 PM - 6:00 PM 第6会場 (6F 602)

座長:由地良太郎(東海大学医学部付属八王子病院)

[131] Comparison of Long View Examination Systems with Different Gd2O2S: Tb Flat Panel Detector Technology: Physical Characterization

○Tsuchida Takuji1,2, 森一也1, 岡田翔太1, 城處洋輔1, 志藤正和1, 富田博信1 (1.Department of radiological technology, Saiseikai kawaguchi general hospital, 2.首都大学東京健康福祉学部大学院　人間健康科学研究科)

Keywords:physics, long view examination, detective quantum efficiency (DQE), flat-panel detector (FPD), system sensitivity

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