Comparison of Long View Examination Systems with Different Gd<sub>2</sub>O<sub>2</sub>S: Tb Flat Panel Detector Technology: Physical Characterization

Tsuchida Takuji

[131] Comparison of Long View Examination Systems with Different Gd₂O₂S: Tb Flat Panel Detector Technology: Physical Characterization

^○Tsuchida Takuji^1,2, 森一也¹, 岡田翔太¹, 城處洋輔¹, 志藤正和¹, 富田博信¹ (1.Department of radiological technology, Saiseikai kawaguchi general hospital, 2.首都大学東京健康福祉学部大学院　人間健康科学研究科)

Keywords:physics, long view examination, detective quantum efficiency (DQE), flat-panel detector (FPD), system sensitivity

Abstract password authentication.
Password is required to view the abstract. Please enter a password to authenticate.

Presentation information

Imaging　System evaluation

[131] Comparison of Long View Examination Systems with Different Gd₂O₂S: Tb Flat Panel Detector Technology: Physical Characterization

Password

Presentation information

Imaging System evaluation

[131] Comparison of Long View Examination Systems with Different Gd2O2S: Tb Flat Panel Detector Technology: Physical Characterization

Password

Imaging　System evaluation

[131] Comparison of Long View Examination Systems with Different Gd₂O₂S: Tb Flat Panel Detector Technology: Physical Characterization