Comparison of Measurement Methods for Half-value Layer in X-ray CT

Presentation information

一般演題（口頭）

Measurement

Fri. Oct 14, 2016 4:50 PM - 5:30 PM 第3会場 (4F 国際会議室)

座長:落合幸一郎(稲城市立病院)

^○Hatai Shiori, 佐藤斉, 五反田留見, 中島絵梨華, 野口和希, 大隅咲季, 石川麻里, 島根佑典 (Ibaraki Prefectural University of Health Sciences)

Keywords:measurement, half value layer (HVL), semiconductor detector

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