[11P-76] 高X線吸収デバイス内部の希薄試料に対するXAFS計測法の開発
Keywords:XAFS、希薄試料、高吸収材料
Abstract password authentication.
Password is required to view the abstract. Please enter a password to authenticate.
[10] X(XAFS)
Sat. Jan 11, 2025 1:00 PM - 3:00 PM [10] X(XAFS) (企業展示・ポスター会場)
Keywords:XAFS、希薄試料、高吸収材料
Abstract password authentication.
Password is required to view the abstract. Please enter a password to authenticate.