第38回日本放射光学会年会・放射光科学合同シンポジウム

Presentation information

[2] ビームライン・測定器

[12P] ビームライン・測定器

Sun. Jan 12, 2025 1:00 PM - 3:00 PM [2] ビームライン・測定器 (企業展示・ポスター会場)

[12P-17] Strain-Induced Relocation and modification of Topological Surface States in Bi 2 Se 3 Single Crystal

*KUMAR YOGENDRA1,2、KUMAR SHIV2、Ideta Shin-ichiro1,2、Okuda Taichi1,2,3,4、Shimada Kenya1,2,3,4 (1. Graduate School of Advanced Science and Engineering, Hiroshima University, Japan 739-0046、2. Hiroshima Research Institute for Synchrotron Radiation Science, Hiroshima University Kagamiyama 2-313, Higashi-Hiroshima 739-0046, JAPAN、3. The International Institute for Sustainability with Knotted Chiral Meta Matter (WPI-SKCM2), Hiroshima University, Higashi-Hiroshima 739-0046, Japan、4. Research Institute for Semiconductor Engineering (RISE), Hiroshima University, Higashi-Hiroshima 739-8527, Japan)

Keywords:Topological Insulator、in-situ Strain、ARPES、Dirac Point、Straintronics

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