[12P-82] 含フッ素高分子材料のX線ダメージ評価および分光測定
Keywords:含フッ素高分子材料、高分子電解質、X線ダメージ、硫黄、XAFS
Abstract password authentication.
Password is required to view the abstract. Please enter a password to authenticate.
[10] X(XAFS)
Sun. Jan 12, 2025 1:00 PM - 3:00 PM [10] X(XAFS) (企業展示・ポスター会場)
Keywords:含フッ素高分子材料、高分子電解質、X線ダメージ、硫黄、XAFS
Abstract password authentication.
Password is required to view the abstract. Please enter a password to authenticate.