[2Aa01-14] データ駆動表面科学研究部会「データ駆動アプローチ研究の最近の動向」

[2Aa05] Multi-frame image super resolution for microscopic spectroscopic images

*Yasuhiko Igarashi¹, Naoka Nagamura^2,3, Hideitsu Hino⁴, Masato Okada⁵ (1. University of Tsukuba, 2. National Institute for Materials Science, 3. Japan Science and Technology Agency, PRESTO, 4. The Institute of Statistical Mathematics, 5. The University of Tokyo)

In recent years, microspectroscopy using synchrotron radiation has been applied to the development of materials. However, the long time measurement by microspectroscopy causes degradation of the sample due to charging effects and thermal drift, which results in artifacts in the measured images. We then performed super-resolution analysis by sparse modeling using several low-resolution images measured in a short time. In this presentation, we will discuss the validity of the above results and future developments of these analysis methods.