Measurement of electromagnetic field using scanning electron microscope with gratings

Presentation information

Poster (core time)

Fri. Nov 5, 2021 1:30 PM - 3:30 PM Ｐ会場 (Ｐ会場)

座長
13:30-14:30　一ノ倉聖（東工大）
14:30-15:30　土師将裕（東大）

*Ken Harada¹, Keiko Sihmada¹, Yoshio Takahashi² (1. RIKEN, 2. Hitachi, Ltd.)

The spatial electromagnetic field was measured by using a scanning electron microscope (SEM).