The 40th Annual Meeting of The Laser Society of Japan

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口頭講演

E: Laser measurement

[E04-22a-VI] 単一光子計測・量子計測

Wed. Jan 22, 2020 9:00 AM - 10:30 AM meeting room 4-2 (exhibition wing)

座長:岸本 直(沖電気工業株式会社 経営基盤本部 研究開発センター)

9:45 AM - 10:15 AM

[E04-22a-VI-03] 【招待講演】
超伝導ナノワイヤを用いた高性能単一光子検出技術の開発

○shigehito Miki1,2, Masahiro Yabuno1, Shigeyuki Miyajima1, Hirotaka Terai1 (1. National Institute of Information and Communications Technology, 2. Kobe University)

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