*Kensuke Kobayashi¹ (1. The University of Tokyo)

Junliang Wang¹, Shunsuke Ota^2,3, Hermann Edlbauer¹, Baptiste Jadot^1,4, Pierre-André Mortemousque^1,4, Aymeric Richard¹, Yuma Okazaki³, Shuji Nakamura³, Arne Ludwig⁵, Andreas D. Wieck⁵, Matias Urdampilleta¹, Tristan Meunier¹, Tetsuo Kodera², Nobu-Hisa Kaneko³, Christopher Bäuerle¹, *Shintaro Takada³ (1. Univ. Grenoble Alpes, CNRS, Grenoble INP, Insitut Néel, 38000, Grenoble, France, 2. Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo 152-8550, Japan, 3. National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ), Ibaraki, 305-8563, Japan, 4. Univ. Grenoble Alpes, CEA, Leti, 38000 Grenoble, France, 5. Lehrstuhl fur Angewandte Festkörperphysik, Ruhr-Universität Bochum Universitätsstraße 150, 44780 Bochum, Germany)

*Junliang Wang¹, Hermann Edlbauer¹, Aymeric Richard¹, Xavier Waintal², Arne Ludwig⁴, Andreas Dirk Wieck⁴, Matias Urdampilleta¹, Tristan Meunier¹, Shintaro Takada³, Christopher Bäuerle¹ (1. Univ. Grenoble Alpes, CNRS, Institut Néel, 38000 Grenoble, France, 2. Univ. Grenoble Alpes, CEA, INAC-Pheliqs, 38000 Grenoble, France, 3. National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8563, Japan, 4. Lehrstuhl für Angewandte Festkörperphysik, Ruhr-Universität Bochum Universitätsstraße 150, 44780 Bochum, Germany)

*sungguen ryu¹, rosa lopez¹, Llorenç serra¹, david sanchez¹ (1. IFISC)