Junliang Wang1, Shunsuke Ota2,3, Hermann Edlbauer1, Baptiste Jadot1,4, Pierre-André Mortemousque1,4, Aymeric Richard1, Yuma Okazaki3, Shuji Nakamura3, Arne Ludwig5, Andreas D. Wieck5, Matias Urdampilleta1, Tristan Meunier1, Tetsuo Kodera2, Nobu-Hisa Kaneko3, Christopher Bäuerle1, *Shintaro Takada3
(1. Univ. Grenoble Alpes, CNRS, Grenoble INP, Insitut Néel, 38000, Grenoble, France, 2. Department of Electrical and Electronic Engineering, Tokyo Institute of Technology, Tokyo 152-8550, Japan, 3. National Institute of Advanced Industrial Science and Technology (AIST), National Metrology Institute of Japan (NMIJ), Ibaraki, 305-8563, Japan, 4. Univ. Grenoble Alpes, CEA, Leti, 38000 Grenoble, France, 5. Lehrstuhl fur Angewandte Festkörperphysik, Ruhr-Universität Bochum Universitätsstraße 150, 44780 Bochum, Germany)
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