Measurement of in-plain conductivity of the interface state formed at the junction between metal and multi-layered MoS<sub>2</sub>

[P19-SF2B-52] Measurement of in-plain conductivity of the interface state formed at the junction between metal and multi-layered MoS₂

Aya Hamamoto¹, Akira Endo², Shingo Katsumoto², *Ryosuke Ishiguro¹ (1. Japan Women's University, 2. The University of Tokyo)

Abstract password authentication.
The password is informed to participants beforehand. You also find it in the program book.