^○Chuan-Hui Zhang, Bao Chen, Peng Shi (University of Science and Technology Beijing, China)

^○Xingjian Zhou, Yichao Zhu (Faculty of vehicle Engineering and Mechanics, Dalian University of Technology, China)

^○Abdullah Al ASAD, Keiichi MITANI, Atsushi ISHIKAWA, Kenji TSURUTA (Dept. of Electrical and Electronic Engineering, Okayama University, Japan)

^○Shunsuke Kobayashi¹, Ryuichi Tarumi², Atsushi Suzuki³, Masao Ogino⁴, Yoji Shibutani¹ (1.Graduate School of Engineering, Osaka Univ., Japan, 2.Graduate School of Engineering Science, Osaka Univ., Japan, 3.Cybermedia Center, Osaka Univ., Japan, 4.Information Technology Center, Nagoya Univ., Japan)

^○John Mitchell (Sandia National Laboratories, United States of America)

^○Zhong-min Wang, Yang Wu, Qingrong Yao, Yan Zhong, Chaohao Hu, Huaiying Zhou (Guilin University of Electronic Technology, China)

^○Narasak Pandech^1,2, Thanundon Kongnok¹, Sirichok Jungthawan¹, Sukit Limpijumnong¹, Walter R.L Lambrecht² (1.School of Physics and NANOTEC-SUT Center of Excellence on Advanced Functional Nanomaterials, Suranaree University of Technology, NakhonRatchasima 30000, Thailand, Thailand, 2.Department of Physics, Case Western Reserve University, Cleveland, Ohio 44106-7079, USA., United States of America)