Accumulation, Depletion, Inversion Processes in Metal/Insulator/p-Si Device Evaluated by Displacement Current Measurement

Hoshito Yamamoto

講演情報

Poster Session

D. Frontiers of Advanced Electronic Materials » [D-2] Frontier in Functional Oxides and Related Materials: from Materials Design to Device Applications

[D2-PV22] Slot 22

2021年12月14日(火) 14:00 〜 15:30 D2-PV22 (online)

14:00 〜 15:30

[D2-PV22-23] Accumulation, Depletion, Inversion Processes in Metal/Insulator/p-Si Device Evaluated by Displacement Current Measurement

*Hoshito Yamamoto¹, Yuya Tanaka^1,2, Tatsuhiro Kambayashi¹, Takeaki Yajima³, Hisao Ishii^1,2,4 (1. GSSE, Chiba Univ. (Japan), 2. CFS, Chiba Univ. (Japan), 3. FISEE, Kyushu Univ. (Japan), 4. MCRC, Chiba Univ. (Japan))

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