Characterizing the time resolved properties and structure of atomic scale defects using AFM techniques

Presentation information

Oral Session

D. Frontiers of Advanced Electronic Materials » [D-3] Defect Functionalized Energy and Electronic Materials

Wed. Dec 15, 2021 9:00 AM - 11:00 AM Room Q (G318)

Chair: Kirk H. Bevan (McGill University), Naoki Ohashi (NIMS)

9:55 AM - 10:25 AM

*Peter Grutter¹ (1. McGill Univ. (Canada))

Keywords:AFM, EFM, pump-probe, non-linear optics, fs time resolution, vacancies

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