Materials Research Meeting 2021

Presentation information

Poster Session

D. Frontiers of Advanced Electronic Materials » [D-3] Defect Functionalized Energy and Electronic Materials

[D3-PR13] Slot 13

Tue. Dec 14, 2021 2:00 PM - 3:30 PM D3-PR13 (G403-404)

2:00 PM - 3:30 PM

[D3-PR13-03] Probe Microscopy Analysis of Defect-Driven Analog Memory Functions of TaOx for Neuromorphic Computing

*Atsushi Tsurumaki-Fukuchi1, Takayoshi Katase2, Hiromichi Ohta3, Masashi Arita1, Yasuo Takahashi1 (1. Faculty of IST, Hokkaido Univ. (Japan), 2. MSL, Tokyo Tech. (Japan), 3. RIES, Hokkaido Univ. (Japan))

Keywords:Memristor, Neuromorphic Device, Defect Migration, Tantalum Oxide, Probe Microscopy, Resistive Switching

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