2:35 PM - 3:00 PM
[D4-O2-03 (Symposium Invited)] Pump-probe X-ray Diffraction Analysis of Lattice Deformation Induced by Inverse Piezoelectric Effect in AlGaN/GaN HEMT Devices
Keywords:Pump-probe method, Nanobeam X-ray diffraction, Inverse piezoelectric effect, AlGaN/GaN HEMT, Time-resolved analysis , gate voltage
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