[D4-O3] Slot 03

[D4-O3-01 (Symposium Invited)] Bayesian measurement

*Masato Okada¹, Kenji Nagata², Shun Katakami¹ (1. Univ. of Tokyo (Japan), 2. National Inst. for Materials Sci. (Japan))

キーワード：Bayesian inference, spectral decomposition, model selection