Measurement of critical shear stress of gold nanocontacts by in-situ transmission electron microscopy equipped with a quartz resonator

Jiaming LIU

Presentation information

Poster Session

D. Frontiers of Advanced Electronic Materials » [D-5] Properties and Characterizations of Functional Surfaces and Interfaces

[D5-PR13] Slot 13

Tue. Dec 14, 2021 2:00 PM - 3:30 PM D5-PR13 (G403-404)

2:00 PM - 3:30 PM

[D5-PR13-07] Measurement of critical shear stress of gold nanocontacts by in-situ transmission electron microscopy equipped with a quartz resonator

*Jiaming LIU¹, Jiaqi Zhang¹, Toyoko Arai², Masahiko Tomitori¹, Yoshifumi Oshima¹ (1. Japan Adv. Inst. Sci. & Technol. (Japan), 2. Kanazawa Univ. (Japan))

Keywords:mechanical properties, critical shear stress, FM-AFM, in-situ TEM, gold

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