Automatic Estimation of XPS Reference Spectra for TiO2 Semiconductor Free from Equipment-derived Arbitrariness

Ryo Murakami

Presentation information

Poster Session

D. Frontiers of Advanced Electronic Materials » [D-5] Properties and Characterizations of Functional Surfaces and Interfaces

[D5-PV21] Slot 21

Mon. Dec 13, 2021 6:30 PM - 8:00 PM D5-PV21 (online)

6:30 PM - 8:00 PM

[D5-PV21-08] Automatic Estimation of XPS Reference Spectra for TiO2 Semiconductor Free from Equipment-derived Arbitrariness

*Ryo Murakami¹, Kenji Nagata², Hideki Yoshikawa², Hiroshi Shinotsuka², Hayaru Shouno¹ (1. The University of Electro-Communications (Japan), 2. NIMS (Japan))

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