[H4-PR15] Slot 15

[H4-PR15-05] Remote measurement of junction temperature of blue-LED module using pulsed-laser Raman scattering

*Kohei Miyoshi¹, Yukihiko Yamagata¹, Takao Shimada², Yoshio Manabe³, Makoto Horiuchi⁴ (1. Kyushu Univ. (Japan), 2. Tsuyama College (Japan), 3. Osaka Univ. (Japan), 4. Panasonic Corp., Ltd. (Japan))

キーワード：LED, Raman scattering, Temperature measurement, GaN