Non-contact atomic force microscopy imaging of line defect on rutile TiO<sub>2</sub>(110)-(1×2)

Daiki Katsube

Presentation information

Oral Session

A. Fundamentals » [A-4] New Materials Science on Nanoscale Structures and Functions of "Crystal Defect Cores"

[A4-O301] Oral 301

Wed. Dec 13, 2023 10:00 AM - 12:00 PM Session 6 (Room F)

Chair: Atsutomo Nakamura (Osaka University), Kazutoshi Inoue (Tohoku University)

11:40 AM - 11:55 AM

[A4-O301-06] Non-contact atomic force microscopy imaging of line defect on rutile TiO₂(110)-(1×2)

*Daiki Katsube¹, Tatsuya Yokoi², Eiichi Inami³, Fengxuan Li⁴, Katsuyuki Matsunaga², Masayuki Abe⁴ (1. RIKEN (Japan), 2. Nagoya Univ. (Japan), 3. Kochi Univ. Tech. (Japan), 4. Osaka Univ. (Japan))

Keywords:non-contact atomic force microscopy, photocatalyst, defect, TiO2

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Presentation information

[A4-O301] Oral 301

[A4-O301-06] Non-contact atomic force microscopy imaging of line defect on rutile TiO2(110)-(1×2)

[A4-O301-06] Non-contact atomic force microscopy imaging of line defect on rutile TiO₂(110)-(1×2)