[A5-O503] Oral 503

[A5-O503-04] System Development for Correlation Analysis with Measurement Meta-data and Spectral Structures in XPS data

*Ryo Murakami¹, Kenji Nagata¹, Hayaru Shouno², Hiroshi Shinotsuka¹, Hideki Yoshikawa¹ (1. NIMS (Japan), 2. The University of Electro-Communications (Japan))

キーワード：Spectral Decomposition, X-ray Photoelectron Spectroscopy, Data Driven Science