[B1-P303] Poster 303

[B1-P303-03] Development of a High Durability SiGe Thermoelectric Module without Electrode at the Hot Side

*Hironori Ohshima¹, Shinichi Fujimoto², Kazuo Nagase¹, Masayuki Murata¹, Atsushi Yamamoto¹, Chul-Ho Lee¹ (1. AIST (Japan), 2. KELK Ltd. (Japan))

キーワード：Thermoelectric, module, high durability, SiGe, FEM simulation