[B2-P303] Poster 303

[B2-P303-07] Development and Application of Simultaneous Operando Time-resolved Fluorescence Mode Quick XAFS/XRD Measurement System

*Tomoya Uruga^1,2, Kotaro Higashi¹, Takuma Kaneko¹, Takafumi Yamamoto³, Saburo Hosokawa⁴ (1. Japan Sync. Rad. Res. Inst. (Japan), 2. Univ. Electro-Comm. (Japan), 3. Tokyo Tech. (Japan), 4. Kyoto Inst. Tech. (Japan))

キーワード：Synchrotron radiation, X-ray, XAFS, XRD, Operando Measurement, Simultaneous measurement