[S2-P304] Poster 304

[S2-P304-31] Optimizing dual-layer oxide thin film transistors with Machine-learning assisted design of experiments: Implementation of Bayesian approach to channel structure

*Jiho Lee¹, Jae Hak Lee¹, Minho Jin¹, Ji Soo Kim¹, Haeyeon Lee¹, Jiyeon Kim¹, Chan Lee¹, Jong Chan Shin¹, Wonho You¹, Hyunkyu Yang¹ (1. Seoul National Univ. (Korea))

Keywords:Oxide semiconductor, Thin film transistor, Dual-layer channel, Machine learning, Bayes' theorem