Test-retest reliability of EEG microstate metrics to assess noise reduction in simultaneous EEG-fMRI

Tomohiko Kishi

[1P-393] Test-retest reliability of EEG microstate metrics to assess noise reduction in simultaneous EEG-fMRI

*Tomohiko Kishi¹, Toshikazu Kuroda¹, Reinmar J Kobler^1,2, Takeshi Ogawa¹, Mizuki Tsutsumi¹, Motoaki Kawanabe^1,2 (1. Advanced Telecommunications Research Institute International, 2. RIKEN AIP)

Keywords:EEG-fMRI, microstate, test-retest reliability, noise reduction

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[1P] 86 Others

[1P-393] Test-retest reliability of EEG microstate metrics to assess noise reduction in simultaneous EEG-fMRI

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