[3P] Imaging and Visualization

[3P-272] A fine scale and low invasive marking method for use with Tungsten microelectrodes

*Tatsuya Oikawa¹, Kento Nomura¹, Toshimitsu Hara¹, Takeshi Kawano², Rika Numano³, Kowa Koida^1,4 (1.Toyohashi Univ of Tech, Dept Computer Sci and Eng, Aichi, Japan, 2.Toyohashi Univ of Tech, Dept Electrical and Electronic Info Eng, Aichi, Japan, 3.Toyohashi Univ of Tech, Dept Applied Chemistry and Life Science, Aichi, Japan, 4.Toyohashi Univ of Tech, Electronics-Inspired Interdisciplinary Research Institute, Aichi, Japan)